Particle characterisation in situ & ex situ
C - Particle characterisation in situ & ex situ
Analytical Centrifugation
Atomic Force Microscopy
Auger Electron Spectroscopy
Bulk-and-Trace Analysis
Characterisation Radiolabelled Nanoparticles
Confocal (Laser Scanning) Microscopy
Field Emission Gun Scanning Electron Microscopy (FEG-SEM)
Focused Ion Beam (FIB)
Helium-ion Microscopy (HIM)
Inductively Coupled Plasma Spectrometry
Mass Spectrometry and Proteomics Platforms
NMR Spectroscopy
Particle sizing and Zeta Potential
Physico-chemical Characterisation
Raman Microscopy
Scanning Electron Microscopy (SEM)
Scanning Tunnel Microscopy
Spectroscopy (UV-Vis, Fluorescence, NIR, micro, etc.)
Synchrotron Radiation Source ANKA
Thermogravimetric and Calorimetric Analysis
Transmission Electron Microscopy (TEM)
X-Ray Absorption Spectroscopy (XAS)
X-ray Diffraction
X-ray Photoelectron Spectroscopy
Jun 11, 2020
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Posted by: admin
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Other
QualityNano is pleased to annouce that the 2015 Edition of the EU Nanosafety Cluster compendium is now available to download from the NSC website, and contains updates from 28 FP7 projects (including updates from several projects that ended some time ago) as well as the first entries from Horizon2020 nanosafety focussed projects.
Mar 23, 2020
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Posted by: admin
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Other
Equipment by Category
- Particle Synthesis
- Particle labelling and pre-processing
- Particle characterisation in situ & ex situ
- Particle Exposure Assessment