Particle characterisation in situ & ex situ
C - Particle characterisation in situ & ex situ
Analytical Centrifugation
Atomic Force Microscopy
Auger Electron Spectroscopy
Bulk-and-Trace Analysis
Characterisation Radiolabelled Nanoparticles
Confocal (Laser Scanning) Microscopy
Field Emission Gun Scanning Electron Microscopy (FEG-SEM)
Focused Ion Beam (FIB)
Helium-ion Microscopy (HIM)
Inductively Coupled Plasma Spectrometry
Mass Spectrometry and Proteomics Platforms
NMR Spectroscopy
Particle sizing and Zeta Potential
Physico-chemical Characterisation
Raman Microscopy
Scanning Electron Microscopy (SEM)
Scanning Tunnel Microscopy
Spectroscopy (UV-Vis, Fluorescence, NIR, micro, etc.)
Synchrotron Radiation Source ANKA
Thermogravimetric and Calorimetric Analysis
Transmission Electron Microscopy (TEM)
X-Ray Absorption Spectroscopy (XAS)
X-ray Diffraction
X-ray Photoelectron Spectroscopy