Sweden: UU
ITEM OF EQUIPMENT | CATEGORY | TECHNOLOGY |
Atomic Force Microscopy | C | Atomic Force Microscopy |
Cell Lab | D | In vitro exposure systems |
Optical Profiling | C | Physico-chemical Characterisation |
Scanning Electron Microscopy (SEM) | C | Scanning Electron Microscopy (SEM) |
Transmission Electron Microscopy (TEM) | C | Transmission Electron Microscopy (TEM) |
X-Ray Photoelectron Spectroscopy (XPS) | C | X-Ray Photoelectron Spectroscopy (XPS) |